Chemical Analysis FIB preparation of an electrical connector and imaging of the layer structure using EDX mapping We offer comprehensive analyses for determining elemental composition and trace element analysis. In doing so, we examine the local phase composition of...
Quantitative Microstructural Analysis ࠗ ࠗ Hard Magnets: Automated Quantitative Microstructure Analysis We offer quantitative microstructural analyses as an integral part of metallographic examinations, enabling objective and reproducible characterization...
X-ray diffraction and phase analysis X-ray diffraction for structural analysis at room temperature and with an in-situ furnace up to 1,200 °C. We use XRD to determine the crystal structure and phase composition of crystalline materials. Rietveld simulations provide...
Damage Analysis Quality control, broken solder joints in microelectronic components We offer you an independent and objective damage analysis in accordance with VDI 3822, tailored specifically to your particular case. Through the targeted use of appropriate measuring...
Physical Examination Weighing of raw materials for property determination. We offer comprehensive characterization of the thermal, physical, and electrochemical properties of modern materials and energy storage systems. This includes the precise determination of...
