We use XRD to determine the crystal structure and phase composition of crystalline materials. Rietveld simulations provide further details and parameters about the materials under investigation, such as crystal structure, phase fractions, lattice strains, and crystallite size.

In combination with linear detectors and furnace systems, we can observe and analyze dynamic processes—such as hardening, bainitizing, precipitation, or phase transformations—in situ up to a temperature of 1200°C.

In addition, we can determine the residual stresses in material samples using X-ray diffraction. In combination with electrolytic etching methods, we can provide you with a depth profile of the residual stress distribution.

A large chamber allows for the measurement of large samples and entire components.