Using state-of-the-art light and scanning electron microscopy, we cover a broad spectrum—from simple routine examinations to highly specialized analytical methods such as EDX, EBSD, WDX, and FIB.

With our automation solutions and the use of ML algorithms, we are able to analyze even large image areas and increase the statistical significance of our results. By employing correlative analysis workflows between XRM and light and scanning electron microscopy, we limit the use of time-consuming detailed analyses and FIB preparations to relevant sample areas.

Typical applications include microstructural analysis, grain size analysis, defect analysis, determination of chemical compositions, FIB analysis, STEM analysis, crystallographic analysis of textures and crystal orientations, visualization of magnetic domains (dynamic Kerr microscopy), and film thickness measurements.

You benefit from our many years of expertise in the analysis and preparation of structural materials, magnetic materials (hard magnets, soft magnets), ceramics, Li-ion batteries, fuel cells, and semiconductor components.